AG Strukturforschung / Elektronenmikroskopie:SEMinar SoSe20: Unterschied zwischen den Versionen
Aus AG Strukturforschung / Elektronenmikroskopie
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| 16.07.2020 || Benedikt || TBD || | | 16.07.2020 || Benedikt || TBD || | ||
| 23.07.2020 || Wouter || Regularized EELS deconvolution || | |||
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Version vom 5. Mai 2020, 14:58 Uhr
Group seminar of the SEM group.
SoSe 2020: Thursdays at 15:00 via zoom or in Denklabor
| Date | Speaker | Title | Comment | ||||
|---|---|---|---|---|---|---|---|
| 23.04.2020 | |||||||
| 30.04.2020 | |||||||
| 07.05.2020 | |||||||
| 14.05.2020 | Holm | EDXS analysis of SiGeSn layers - pitfalls and solution | |||||
| 21.05.2020 | |||||||
| 28.05.2020 | Alberto | tba | |||||
| 04.06.2020 | Sam | tba | |||||
| 11.06.2020 | Fabian | Structure reconstruction with Bayesian Optimization | |||||
| 18.06.2020 | Johannes | New results from the SEM | |||||
| 25.06.2020 | Tom | tba | |||||
| 02.07.2020 | Sherjeel | tba | |||||
| 09.07.2020 | Marcel | tba | |||||
| 16.07.2020 | Benedikt | TBD | 23.07.2020 | Wouter | Regularized EELS deconvolution |